Now showing items 1-2 of 2

  • Benchmarking of electro-optic monitors for femtosecond electron bunches 

    Berden, G.; Gillespie, W. A.; Jamison, S. P.; Knabbe, E. A.; MacLeod, Allan M.; van der Meer, A. F. G.; Phillips, P. J.; Schlarb, H.; Schmidt, B.; Schmuser, P.; Steffen, B. (American Physical Society, 2007-10)
    The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the ...
  • Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: Experiment, simulation and validation 

    Steffen, B.; Knabbe, E. A.; Schlarb, H.; Schmidt, B.; Schmuser, P.; Gillespie, W. A.; Phillips, P. J.; Jamison, S. P.; Berden, G.; van der Meer, A. F. G.; MacLeod, Allan M. (Joint Accelerator Conferences Website, 2007)
    At the superconducting linac of FLASH at DESY, we have installed an electro-optic (EO) experiment for singleshot, non-destructive measurements of the longitudinal electric charge distribution of individual electron bunches. ...