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Browsing by Author Steffen, B.

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Issue DateTitleAuthor(s)Type
Oct-2007Benchmarking of electro-optic monitors for femtosecond electron bunchesBerden, G.; Gillespie, W. A.; Jamison, S. P.; Knabbe, E. A.; MacLeod, Allan M.; van der Meer, A. F. G.; Phillips, P. J.; Schlarb, H.; Schmidt, B.; Schmuser, P.; Steffen, B.Article
2008Electro-optic techniques for longitudinal electron bunch diagnosticsBerden, G.; van der Meer, A. F. G.; Jamison, S. P.; Steffen, B.; Schmidt, B.; Schmüser, P.; MacLeod, Allan M.; Gillespie, W. A.; Phillips, P. J.Conference Paper
Mar-2009Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASHSteffen, B.; Arsov, V.; Berden, G.; Gillespie, W. A.; Jamison, S. P.; MacLeod, Allan M.; van der Meer, A. F. G.; Phillips, P. J.; Schlarb, H.; Schmidt, B.; Schmüser, P.Journal Article
2007Single shot longitudinal bunch profile measurements by temporally resolved electro-optical detectionPhillips, P. J.; Gillespie, W. A.; Steffen, B.; Knabbe, E-A.; Schmidt, B.; Schmüser, P.; Jamison, S. P.; Berden, G.; van der Meer, A. F. G.; MacLeod, Allan M.Conference Paper
2007Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: Experiment, simulation and validationSteffen, B.; Knabbe, E. A.; Schlarb, H.; Schmidt, B.; Schmuser, P.; Gillespie, W. A.; Phillips, P. J.; Jamison, S. P.; Berden, G.; van der Meer, A. F. G.; MacLeod, Allan M.Conference item
2007Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: experiment, simulation, and validation.Steffen, B.; Knabbe, E-A.; Schlarb, H.; Schmidt, B.; Schmüser, P.; Gillespie, W. A.; Phillips, P. J.; Jamison, S. P.; Berden, G.; van der Meer, A. F. G.; MacLeod, Allan M.Conference Paper
Showing results 1 to 6 of 6

 

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