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  • Benchmarking of electro-optic monitors for femtosecond electron bunches 

    Berden, G.; Gillespie, W. A.; Jamison, S. P.; Knabbe, E. A.; MacLeod, Allan M.; van der Meer, A. F. G.; Phillips, P. J.; Schlarb, H.; Schmidt, B.; Schmuser, P.; Steffen, B. (American Physical Society, 2007-10)
    The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the ...