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Please use this identifier to cite or link to this item: http://hdl.handle.net/10373/1022

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Title: Built-in self-test in intelligent microsystems as a contributor to system quality and performance
Authors: Olbrich, T.
Bradley, David A.
Richardson, A. M. D.
Affiliation: University of Abertay Dundee. School of Computing & Engineering Systems
Keywords: Microsystems
Smart sensors
Self-test
Testability
Diagnosis
Quality
Issue Date: 1996
Publisher: Taylor & Francis
Type: Journal Article
Refereed: peer-reviewed
Rights: Published version (c)Taylor & Francis, available from http://dx.doi.org/10.1080/08982119608904671
Citation: Olbrich, T., Bradley, D.A. and Richardson, A.M.D. 1996. Built-in self-test in intelligent microsystems as a contributor to system quality and performance. Quality Engineering. 8(4): pp.601-613. Available from http://dx.doi.org/10.1080/08982119608904671
URI: http://hdl.handle.net/10373/1022
ISSN: 0898-2112
Appears in Collections:Computing & Engineering Systems Collection

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