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|Title: ||Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles|
|Authors: ||Berden, G.|
Jamison, S. P.
MacLeod, Allan M.
Gillespie, W. A.
van der Meer, A. F. G.
|Affiliation: ||University of Abertay Dundee. School of Contemporary Sciences|
|Keywords: ||Electron beams|
|Issue Date: ||Sep-2004|
|Publisher: ||American Physical Society|
|Type: ||Journal Article|
|Rights: ||Published version (c)American Physical Society, available from DOI: 10.1103/PhysRevLett.93.114802|
|Citation: ||Berden, G., et al. 2004. Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles. Physical Review Letters. 93(11). [Online] Available from: DOI: 10.1103/PhysRevLett.93.114802|
|Abstract: ||Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (∼275 fs rms) long bunches.|
|Appears in Collections:||Science Engineering & Technology Collection|
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