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|Title: ||Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH|
|Authors: ||Steffen, B.|
Gillespie, W. A.
Jamison, S. P.
MacLeod, Allan M.
van der Meer, A. F. G.
Phillips, P. J.
|Affiliation: ||University of Abertay Dundee. School of Computing and Engineering Systems|
Electron bunch length monitor
|Issue Date: ||Mar-2009|
|Publisher: ||American Physical Society|
|Type: ||Journal Article|
|Rights: ||Published version (c)American Physical Society, available from DOI: 10.1103/PhysRevSTAB.12.032802|
|Citation: ||Steffen, B. et al. 2009. Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH. Physical Review Special Topics Accelerators and Beams. 12(3). Available from: DOI: 10.1103/PhysRevSTAB.12.032802|
|Abstract: ||Precise measurements of the temporal proﬁle of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time proﬁle of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deﬂecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.|
|Appears in Collections:||Computing & Engineering Systems Collection|
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