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Please use this identifier to cite or link to this item: http://hdl.handle.net/10373/328

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Title: Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH
Authors: Steffen, B.
Arsov, V.
Berden, G.
Gillespie, W. A.
Jamison, S. P.
MacLeod, Allan M.
van der Meer, A. F. G.
Phillips, P. J.
Schlarb, H.
Schmidt, B.
Schmüser, P.
Affiliation: University of Abertay Dundee. School of Computing and Engineering Systems
Keywords: Electro-optic
Electron bunch length monitor
Issue Date: Mar-2009
Publisher: American Physical Society
Type: Journal Article
Refereed: peer-reviewed
Rights: Published version (c)American Physical Society, available from DOI: 10.1103/PhysRevSTAB.12.032802
Citation: Steffen, B. et al. 2009. Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH. Physical Review Special Topics Accelerators and Beams. 12(3). Available from: DOI: 10.1103/PhysRevSTAB.12.032802
Abstract: Precise measurements of the temporal profile of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time profile of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deflecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.
URI: http://hdl.handle.net/10373/328
ISSN: 1098-4402
Appears in Collections:Computing & Engineering Systems Collection

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