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Please use this identifier to cite or link to this item: http://hdl.handle.net/10373/611

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Title: Electro-optic techniques for longitudinal electron bunch diagnostics
Authors: Berden, G.
van der Meer, A. F. G.
Jamison, S. P.
Steffen, B.
Schmidt, B.
Schmüser, P.
MacLeod, Allan M.
Gillespie, W. A.
Phillips, P. J.
Affiliation: University of Abertay Dundee. School of Computing & Engineering Systems
Keywords: Electro-optic
Electron bunch diagnostics
Issue Date: 2008
Type: Conference Paper
Refereed: peer-reviewed
Rights: This is the published version of the Conference Paper (c)FEL08. Available from Joint Accelerated Conferences Website (JACoW) at: http://www.jacow.org/
Citation: Berden, G. et al. 2008. Electro-optic techniques for longitudinal electron bunch diagnostics. In: Proceedings of the 30th International Free Electron Laser Conference: FEL08, Gyeongju, 24-29 August 2009.[Online] Available from http://accelconf.web.cern.ch/AccelConf/FEL2008/papers/tupph076.pdf
Abstract: Electro-optic techniques are becoming increasingly important in ultrafast electron bunch longitudinal diagnostics and have been successfully implemented at various accelerator laboratories. The longitudinal bunch shape is directly obtained from a single-shot, non-intrusive measurement of the temporal electric field profile of the bunch. Further- more, the same electro-optic techniques can be used to measure the temporal profile of terahertz / far-infrared opti- cal pulses generated by a CTR screen, at a bending magnet (CSR), or by an FEL. This contribution summarizes the re- sults obtained at FELIX and FLASH.
URI: http://hdl.handle.net/10373/611
Appears in Collections:Computing & Engineering Systems Collection

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