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Please use this identifier to cite or link to this item: http://hdl.handle.net/10373/613

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Title: Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: experiment, simulation, and validation.
Authors: Steffen, B.
Knabbe, E-A.
Schlarb, H.
Schmidt, B.
Schmüser, P.
Gillespie, W. A.
Phillips, P. J.
Jamison, S. P.
Berden, G.
van der Meer, A. F. G.
MacLeod, Allan M.
Affiliation: University of Abertay Dundee. School of Computing & Engineering Systems
Keywords: Electro-optic
Electron bunch diagnostics
Issue Date: 2007
Type: Conference Paper
Refereed: peer-reviewed
Rights: This is the published version of the Conference Paper (c)Joint Accelerator Conference Website (JACoW), Available at http://www.jacow.org/
Citation: Steffen, B. et al. 2007. Single-shot longitudinal bunch profile measurements at FLASH using electro-optic detection: experiment, simulation, and validation. In: Proceedings of the 29th International Free Electron Laser Conference (FEL07), Novosibirsk August 26-31 2007. [Online] Available from: http://accelconf.web.cern.ch/AccelConf/f07/PAPERS/WEBAU04.PDF
Abstract: At the superconducting linac of FLASH at DESY, we have installed an electro-optic (EO) experiment for single- shot, non-destructive measurements of the longitudinal electric charge distribution of individual electron bunches. The time profile of the electric bunch field is electro- optically encoded onto a chirped titanium-sapphire laser pulse. In the decoding step, the profile is retrieved either from a cross-correlation of the encoded pulse with a 30 fs laser pulse, obtained from the same laser (electro- optic temporal decoding, EOTD), or from the spectral intensity of the transmitted probe pulse (electro-optic spectral decoding, EOSD). At FLASH, the longitudinally compressed electron bunches have been measured during FEL operation with a resolution of better than 50 fs. The electro-optic process in gallium phosphide was numerically simulated using as input data the bunch shapes determined with a transverse-deflecting RF structure. In this contribution, we present electro-optically measured bunch profiles and compare them with the simulation.
URI: http://hdl.handle.net/10373/613
Appears in Collections:Computing & Engineering Systems Collection

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