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Please use this identifier to cite or link to this item: http://hdl.handle.net/10373/66

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Title: Benchmarking of electro-optic monitors for femtosecond electron bunches
Authors: Berden, G.
Gillespie, W. A.
Jamison, S. P.
Knabbe, E. A.
MacLeod, Allan M.
van der Meer, A. F. G.
Phillips, P. J.
Schlarb, H.
Schmidt, B.
Schmuser, P.
Steffen, B.
Affiliation: University of Abertay Dundee. School of Computing and Creative Technologies
Keywords: Relativistic electron and positron beams
Free-electron lasers
Beam profile
Beam intensity
Issue Date: Oct-2007
Publisher: American Physical Society
Type: Article
Refereed: Peer reviewed
Rights: This is the author's final version of this article. Published version (c)American Physical Society, available from http://link.aps.org/abstract/PRL/v99/e164801
Citation: Berden, G. et al. 2007. Benchmarking of electro-optic monitors for femtosecond electron bunches. Physical Review of Letters. 99, 164801 (2007), DOI:10.1103/PhysRevLett.99.164801
Abstract: The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
URI: http://hdl.handle.net/10373/66
Appears in Collections:Computing & Engineering Systems Collection

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