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|Title: ||Benchmarking of electro-optic monitors for femtosecond electron bunches|
|Authors: ||Berden, G.|
Gillespie, W. A.
Jamison, S. P.
Knabbe, E. A.
MacLeod, Allan M.
van der Meer, A. F. G.
Phillips, P. J.
|Affiliation: ||University of Abertay Dundee. School of Computing and Creative Technologies|
|Keywords: ||Relativistic electron and positron beams|
|Issue Date: ||Oct-2007|
|Publisher: ||American Physical Society|
|Refereed: ||Peer reviewed|
|Rights: ||This is the author's final version of this article. Published version (c)American Physical Society, available from http://link.aps.org/abstract/PRL/v99/e164801|
|Citation: ||Berden, G. et al. 2007. Benchmarking of electro-optic monitors for femtosecond electron bunches. Physical Review of Letters. 99, 164801 (2007), DOI:10.1103/PhysRevLett.99.164801|
|Abstract: ||The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.|
|Appears in Collections:||Computing & Engineering Systems Collection|
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