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Please use this identifier to cite or link to this item: http://hdl.handle.net/10373/954

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Title: Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis
Authors: Canetta, Elisabetta
Adya, Ashok K.
Affiliation: University of Abertay Dundee. School of Contemporary Sciences
Keywords: Atomic force microscopy (AFM)
Force mapping
Nanotechnology
Pressure sensitive adhesive (PSA)
Mechanical properties
Items of recovery
Issue Date: Jul-2011
Publisher: Elsevier
Type: Journal Article
Refereed: peer-reviewed
Rights: This is the author's final version of this article. Published version (c)Elsevier, available from http://dx.doi.org/10.1016/j.forsciint.2011.01.029
Citation: Canetta, E. and Adya, A.K. 2011. Atomic force microscopic investigation of commercial pressure sensitive adhesives for forensic analysis. Forensic Science International. 210(1-3): pp.16-25. Available from http://dx.doi.org/10.1016/j.forsciint.2011.01.029
Abstract: Pressure sensitive adhesive (PSA), such as those used in packaging and adhesive tapes, are very often encountered in forensic investigations. In criminal activities, packaging tapes may be used for sealing packets containing drugs, explosive devices, or questioned documents, while adhesive and electrical tapes are used occasionally in kidnapping cases. In this work, the potential of using atomic force microscopy (AFM) in both imaging and force mapping (FM) modes to derive additional analytical information from PSAs is demonstrated. AFM has been used to illustrate differences in the ultrastructural and nanomechanical properties of three visually distinguishable commercial PSAs to first test the feasibility of using this technique. Subsequently, AFM was used to detect nanoscopic differences between three visually indistinguishable PSAs.
URI: http://hdl.handle.net/10373/954
ISSN: 0379-0738
Appears in Collections:Science Engineering & Technology Collection

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